CH-12 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,
CT-6 non-vacuum high and low temperature probe station
Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.
CGO-Variable temperature vacuum probe station
High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.
CP200 semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.
Kelvin / pulse probe
specification: Resolution: less than 10fA Probe pitch: from 12 to 100 μm can be customized according to requirements Very low parasitic capacitance
Electron microscope probe
PT-14-6705-B electron microscope probe
Optical fiber cold light source
Piezo motor, nano-scale stage
Triaxial (mother) to Coaxial (mother)
Triaxial (female) to Coaxial (male)
